Micro/nano analysis of tooth microstructures by Focused Ion Beam (FIB) cross-sectioning

Since dental structures are hard and fragile, cross-sectioning of these materials using ultramicrotomy and other techniques and following micro and nano dorisvale station for sale analysis cause problems.The use of FIB-SEM dual beam platforms is the most convenient solution for investigating the microstructures, site-specifically and in certain geometries.Dual beam platforms allow for imaging at high magnifications and resolutions and simultaneous elemental analysis.In this study, the micro/nano-structural and chemical differences were revealed in dentin tenga flip orb and enamel samples.

The investigation of dental tissues having different morphologies and chemical components by ion-cross-sectioning is important for the use of FIB-SEM platforms in dentistry in Turkey.

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